專業8NTS-XYZ-200 - 2(3)D piezo scanning stage廠商

		Double capacity sensor technology for feedback
		Travel range in horizontal directions up to 200 µm
		Travel range in vertical direction up to 20 µm
		Ultra high resolution: 0.1 nm
		Low cost
		Compact design and low weight
		Suitable for universal applications
		High stiffness
		Compensated creep effect
		Low-frequency noise resistance
		Ideal capable for microscopic application
		Vacuum version available

Every year Standa Company supplies for laboratories and linear motion market thousands of unique translation and rotation positioners for a wide spectrum of positioning applications. Nanometer and Sub-nanometer resolution is impossible to reach with high-speed screw drives and linear motors, for thisreason, we have prepared product line based on piezo elements.

Series 8NTS are perfectly suitable for smooth sub-nanometer translation of optical elements or probe in open and closed loop system.

Movable central part hangs on flexible springs and is driven with piezo actuators to ensure high stiffness and stability of theapplication. 8NTS design provides excellent linearity and flatness of the movement, in contrast to the classical scanners based on piezoelectric tubes, where the scan surface is a sphere. In addition, plane-parallel scanners have higher mechanical strength, compared with fragile piezoelectric tubes.

2(3)D PIEZO SCANNING STAGE 8NTS-XY(Z)-200 are equipped with capacitive displacement sensors for digital closed-loop control. It provides high accuracy and linearity of movement and eliminates the creep effect inherent for piezoceramics. Capacitance measurements are made with TDC (time-to-digital conversion) technology where all measuring electronics is located as close as possible to the sensors. Such a design leads to the low-noise and high-speed displacement control.

To control 8NTS-XY(Z)-200 piezo stage, universal controllers 8NSC-3000 or 8NSC-1000 are used as well as NSpec software.

Applications of 8NTS-XY(Z)-200 include scanning probe microscopy (e.g. atomic force microscopy), nanopositioning, metrology, biology research, microelectronics, micromanipulation etc.